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DtifEasy Series
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LASAR Post Processor, Run Time and Diagnostic Test Solution
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Product InfoArchitectureUsing DtifEasySpecification
Ordering
 | Imports, converts and executes IEEE-1445 compliant .tap files from a LASAR simulation for use with Geotest digital hardware and digital functional test systems |
| Supports Geotest GX529x and GX5055 digital instrumentation |
| Full support for go / no-go, fault dictionary and guided probe functionality |
| ATEasy/Windows 32 application with test executive GUI simplifies development and deployment of applications |
| Guided probe offers both textual and UUT image probing aides, guided probe tree display, and repeat / skip probes – simplifying the diagnosis of UUT
faults |
| Open architecture supports interfaces for programming languages including CVI, LabView, VB, and C/C++ |
| Available with preconfigured Geotest digital subsystems and digital test systems |
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DescriptionDtifEasy is a full-featured tool set for importing, converting, and executing IEEE-1445 compliant digital test vectors generated by a LASAR simulation. All four IEEE-1445 file types - UUT model group, Stimulus and Response group, Fault Dictionary group, and Probe group are supported by DtifEasy; providing the user with the ability to execute go/no-go, fault dictionary, and guided probe sequences. DtifEasy supports Geotest’s 3U PXI GX529x series of dynamic digital instrumentation to 200 MHZ and the 6U PXI GX5055, 50 MHz digital instrument. Both of these instrument families are compatible with the digital logic probe.
Overall control and execution of the .tap file conversion process, UUT configuration, and execution of go/no-go and probing sequences is provided by the ATEasy test development / execution environment which is included with the DtifEasy product. And depending on your specific programming needs, the user has the option to develop applications using ATEasy exclusively or control and execute go/no-go and probing sequences using other programming languages such as CVI, LabVIEW, C, C++, and VB.
The DtifEasy conversion tools in conjunction with Geotest digital instrumentation / systems offers a low cost and superior solution for those users needing to migrate existing LASAR based applications (with .tap files) from a legacy platform to a new test platform. Similarly, by re-simulating UUTs using LASAR (purchased separately), DtifEasy offers users a cost-effective method to re-host UUTs on lower cost, PXI-based, digital functional test platforms.
FeaturesDtifEasy can convert and execute all of the IEEE-1445 file types for use with Geotest digital instrumentation and guided probe. All imported .tap files, information for guided probing (including optional images of the UUT), the digital subsystem configuration, and UUT adapter pin mapping are defined in an XML file format – providing a unified and easy way to store and manage all test information for the application.
The guided probe consists of a digital probe, a momentary push button and a status indicator. The probe is compatible with both the GX529x and GX5055 digital instruments and provides the probed UUT states for the guided probe sequence. The guided probe algorithm will detect “stuck at’s”, supports re-probing of nodes, and allows the skipping of component / node probes - speeding up the overall diagnosis of a UUT. Optionally, the user can incorporate images of the UUT, providing a graphical probe position tool to aid the user when probing the UUT.
Other features include the logging of tests, probes, and fault dictionary results in text or HTML format. Support for event programming is also provided, allowing for the initialization or control of the UUT before or after probe events or sequences. The DtifEasy conversion tool can also combine UUT input & output pins - conserving tester I/O resources and resulting in smaller channel count systems. This is particularly useful when converting legacy test programs which may have relied upon dedicated input and output digital test channels.
Applications | Convert / re-host digital test applications deployed on legacy test systems such as the DTS-70, L200, L300, Spectrum 9100, GR179x, GR2750, GR2225, or S790 |
| Deployment of LASAR-based applications on PXI-based test platforms |
Awards
See Also
| DIOEASY - Digital I/O Vector Development Software | | DIOEasy Training - DIOEasy Training (Customer or Geotest Site) | | GC5910 Series - TTL I/O Modules for GC5050 Card | | GC5930 - Programmable Levels I/O Module for GC5050 Card | | GC5960 - LVDS I/O Module for GC5050 Card | | GT50-256K - 256K Memory Block for GT50-DIO (Previously GT50-256K-12) | | GT5910 - TTL I/O Module for GT5xxx Cards | | GT5920 - 100 MHz I/O Module | | GT5930 - Programmable-Levels I/O Module for GT5xxx Cards | | GT5940 Series - PECL I/O Modules for GT515x Cards | | GT5960 - LVDS I/O Module for GT5xxx Cards | | GX5001 - GX515x Memory Module, 1Mbx32, for 50MHz applications. 2-9 modules per GX515x | | GX5002 - GX515x Memory Module, 2Mbx32, for 50MHz applications. 2-9 modules per GX515x | | GX5004-40 - GX515x Memory Module, 4Mbx32, for 40MHz applications. 2-9 modules per GX515x | | GX5006 - GX515x Memory Module, 256Kbx32, for 25/50MHz applications. 2-9 modules per GX515x | | GX5701 - Digital Input Latch Module for GX5733 | | GX5702 - Digital Output Latch Module for GX5733 | | GX5704 - Digital Power Output Latch Module for GX5733 | | GX5709 - RS-422 Differential Digital I/O Module for GX5733 | | GX5712 - 16 Ch. RS-422 to TTL Bi-Directional Converter for GX5733 | | GX5910 - TTL I/O Module | | GX5930 - Programmable Level I/O Module | | GX5940 - PECL I/O Module | | GX5960 - LVDS I/O Module |
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Below is a block diagram depicting the DtifEasy process from creating the application, importing TAP files to running and debugging the UUT:
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The following are several screen captures showing how DtifEasy is used:
1. Use the ATEasy application wizard to generate a DtifProject:
2. Run the application generated by ATEasy and import the TAP files to generate an XML file where all the project information is saved. You can also Import UUT images and mark components and pins (see step 5) to assist in probing the UUT. :
3. Setup and assign/map your UUT pins to the DIO cards you are using:
4. Add events code, allowing for the initialization or control of the UUT before or after probe events or sequences:
5. Run, if the test fails, you can use the guided probe which will guide you in probing the board in order to identify the failing components or connections.:
6. The probe can alert you for conditions such as stuck lows or no connection:
7. A Log file is created accumulating your results and the test sequence:
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| DtifEasy - LASAR Post Processor, Run Time and Diagnostic Test Solution | | Compatibility | IEEE Standard 1445-1998 (R2004), Digital Test
Interchange Format (DTIF) | | Supported File Groups | UUT Model Group, Stimulus and Response
Group, Fault Dictionary Group, Probe Group | | Supported Digital Test Hardware | GX5055, 6U PXI, 32 channel digital instrument
GX529x, 3U PXI, 32 channel digital instrument | | Digital Test Modes | Go/no-go, Fault dictionary, guided probe | | Test and Probe Log Data File Formats | Text and HTML | | Number of Digital Channels Supported | 256 | | Digital Probe | Logic probe with integrated status indicator
and push button, requires 3 digital channels | | Compatible Test Systems | | TS-730 | Preconfigured, mixed-signal test platform.
Includes up to 96 dynamic digital channels,
user power, and analog stimulus / measurement
resources. | | TS-750 | Preconfigured, digital test platform. Includes up
to 128 dynamic digital channels, user power ,
DMM and static digital resources. | | TS-775 | Preconfigured, military avionics test platform.
Includes up to 96 dynamic digital channels,
user power, DMM, 1553 interface, and static
digital resources. | | Compatible Digital Instruments | | GX529x Series | GX5292: 3U PXI, 100 MHz, 32 channel dynamic
digital instrument. Per channel and per
vector drive/ sense control.
GX5293: 3U PXI, 200 MHz, 16 channel dynamic
digital instrument. Per channel and per
vector drive/ sense control. | | GX5055 | 6U PXI, 50 MHz, 32 channel dynamic digital
instrument.
Per channel, -10 to +15 volt programmable
driver / sensors | |
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LASAR is a tradename of Teradyne, Inc.
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Note: Specifications are subject to change without notice.
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