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LASAR Post Processor, Run Time and Diagnostic Test Solution
Imports, converts and executes IEEE-1445 compliant .tap files from a LASAR simulation for use with Geotest digital hardware and digital functional test systems
Supports Geotest GX5960 digital instrumentation
Full support for go / no-go, fault dictionary and guided probe functionality
ATEasy/Windows 32 application with test executive GUI simplifies development and deployment of applications
Guided probe offers both textual and UUT image probing aides, guided probe tree display, and repeat / skip probes – simplifying the diagnosis of UUT
Open architecture supports interfaces for programming languages including CVI, LabView, VB, and C/C++
Available with preconfigured Geotest digital subsystems and digital test systems
DtifEasy is a full-featured tool set for importing, converting, and executing IEEE-1445 compliant digital test vectors generated by a LASAR simulation. All four IEEE-1445 file types - UUT model group, Stimulus and Response group, Fault Dictionary group, and Probe group are supported by DtifEasy; providing the user with the ability to execute go/no-go, fault dictionary, and guided probe sequences. DtifEasy supports Geotest’s 3U PXI GX529x series of dynamic digital instrumentation to 200 MHZ as well as the 6U PXI GX5055 and GX5960, 50 MHz digital instrumentation. All of these instrument families are compatible with the digital logic probe.
Overall control and execution of the .tap file conversion process, UUT configuration, and execution of go/no-go and probing sequences is provided by the ATEasy test development / execution environment which is included with the DtifEasy product. And depending on your specific programming needs, the user has the option to develop applications using ATEasy exclusively or control and execute go/no-go and probing sequences using other programming languages such as CVI, LabVIEW, C, C++, and VB.
The DtifEasy conversion tools in conjunction with Geotest digital instrumentation / systems offers a low cost and superior solution for those users needing to migrate existing LASAR based applications (with .tap files) from a legacy platform to a new test platform. Similarly, by re-simulating UUTs using LASAR (purchased separately), DtifEasy offers users a cost-effective method to re-host UUTs on lower cost, PXI-based, digital functional test platforms.
DtifEasy can convert and execute all of the IEEE-1445 file types for use with Geotest digital instrumentation and guided probe. All imported .tap files, information for guided probing (including optional images of the UUT), the digital subsystem configuration, and UUT adapter pin mapping are defined in an XML file format – providing a unified and easy way to store and manage all test information for the application.
The guided probe consists of a digital probe, a momentary push button and a status indicator. The probe is compatible with the GX529x, GX5055 and GX5960 digital instruments and provides the probed UUT states for the guided probe sequence. The guided probe algorithm will detect “stuck at’s”, supports re-probing of nodes, and allows the skipping of component / node probes - speeding up the overall diagnosis of a UUT. Optionally, the user can incorporate images of the UUT, providing a graphical probe position tool to aid the user when probing the UUT.
Other features include the logging of tests, probes, and fault dictionary results in text or HTML format. Support for event programming is also provided, allowing for the initialization or control of the UUT before or after probe events or sequences. The DtifEasy conversion tool can also combine UUT input & output pins - conserving tester I/O resources and resulting in smaller channel count systems. This is particularly useful when converting legacy test programs which may have relied upon dedicated input and output digital test channels.
Convert / re-host digital test applications deployed on legacy test systems such as the DTS-70, L200, L300, Spectrum 9100, GR179x, GR2750, GR2225, or S790
Deployment of LASAR-based applications on PXI-based test platforms
- Dynamically Controlled, High Voltage Digital I/O PXI Card with Pin Electronics
- Dynamically Controlled High Speed Digital I/O PXI Card
- Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
- High Performance Dynamic Digital I/O PXI Subsystem
Below is a block diagram depicting the DtifEasy process from creating the application, importing TAP files to running and debugging the UUT:
The following are several screen captures showing how DtifEasy is used:
1. Use the ATEasy application wizard to generate a DtifProject:
2. Run the application generated by ATEasy and import the TAP files to generate an XML file where all the project information is saved. You can also Import UUT images and mark components and pins (see step 5) to assist in probing the UUT. :
3. Setup and assign/map your UUT pins to the DIO cards you are using:
4. Add events code, allowing for the initialization or control of the UUT before or after probe events or sequences:
5. Run, if the test fails, you can use the guided probe which will guide you in probing the board in order to identify the failing components or connections.:
6. The probe can alert you for conditions such as stuck lows or no connection:
7. A Log file is created accumulating your results and the test sequence
DtifEasy - LASAR Post Processor, Run Time and Diagnostic Test Solution
IEEE Standard 1445-1998 (R2004), Digital Test Interchange Format (DTIF)
Supported File Groups
UUT Model Group, Stimulus and Response Group, Fault Dictionary Group, Probe Group
Supported Digital Test Hardware
GX5055, 6U PXI, 32 channel digital instrument
GX5960, 6U PXI, 32 & 16 channel instruments
GX529x, 3U PXI, 32 channel digital instrument
Digital Test Modes
Go/no-go, Fault dictionary, guided probe
Test and Probe Log Data File Formats
Text and HTML
Maximum Number of Digital Channels Supported
Logic probe with integrated status indicator and push button, requires 3 digital channels
Compatible Test Systems
Preconfigured, mixed-signal test platform.
Includes up to 96 dynamic digital channels, user power, and analog stimulus / measurement resources.
Preconfigured, digital test platform. Includes up to 128 dynamic digital channels, user power, DMM and static digital resources.
Preconfigured, military avionics test platform.
Includes up to 96 dynamic digital channels, user power, DMM, 1553 interface, and static digital resources.
Compatible Digital Instruments
GX5292: 3U PXI, 100 MHz, 32 channel dynamic digital instrument. Per channel and per vector drive/ sense control.
GX5293: 3U PXI, 200 MHz, 16 channel dynamic digital instrument. Per channel and per vector drive/ sense control.
GX5295: 3U PXI, 100 MHz, 32 channel dynamic digital instrument with programmable pin electronics and per pin PMU
6U PXI, 50 MHz, 32 channel dynamic digital instrument. Per channel, -10 to +15 volt programmable driver / sensors
6U PXI, 50 MHz, 32 dynamic digital subsystem. Per channel, -10 to +15 volt programmable driver / sensors, 256 time sets, with 1ns edge resolution
LASAR is a tradename of Teradyne, Inc.
Note: Specifications are subject to change without notice.
Prices are specified for
(Prices are noted in USD)
To order call
or order online via the form below.
Call for Pricing **
LASAR Post Processor, Development, Run Time and Diagnostic Test Solution
Call for Pricing **
LASAR Post Processor Run Time and Diagnostic Test Solution
Required / Recommended Products
No Required/Recommended Products Found
Licenses (Min. 3)
click to enlarge
DtifEasy Data Sheet
6/12/2012 : 1.14 MB
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